Beam Characterization of a 445 nm, 10 W Fiber-Coupled Diode Laser Using a NanoScan V2 Scanning-Slit Beam Profiler

This dataset contains spatial beam profile measurements acquired from a 445 nm fiber-coupled diode laser (BWT K445HMTFN-10.00WN1N) using a NanoScan V2 scanning-slit beam profiling system. Measurements were performed under controlled laboratory conditions to evaluate beam quality, beam diameter evolution, ellipticity, divergence characteristics, and thermal stability. Laser package temperature was monitored using the integrated NTC thermistor to investigate thermal influences on beam quality and pointing stability. The resulting dataset supports investigation of high-power blue diode laser sources for additive material processing and to facilitate optical-collimation to Gaussian-beam propagation analysis and optimisation.