Supplementary Material
收藏DataCite Commons2025-06-04 更新2025-06-14 收录
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https://aip.figshare.com/articles/dataset/Supplementary_Material/29098721/1
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资源简介:
Supplementary material for experiment methods of device fabrication and measurements, Raman spectra, capacitance-frequency and phase angle-frequency Measurements, Calculation using the mass action law, TRPL measurements and DFT calculations details.
提供机构:
AIP Publishing
创建时间:
2025-06-04



