Multi-beam ptychographic tomography for rapid nano-imaging of technical catalysts on extended length scale
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Multibeam X-ray ptychography, a recent innovation, offers substantial potential for replacing the conventional single-beam method. This technique maximizes synchrotron photon utilization, enabling significant gains in both scan field-of-view (FOV) and measurement speed, thus opening new avenues for functional studies. We've successfully applied this approach across a range of energies (7-20 keV) and sample types (Microchip, SiemensStar, Catalyst, etc.) using up to 12 parallel beams. To fully harness the method's capabilities, we aim to employ a complete ESRF-EBS monochromatic beam at 17 keV using 20 parallel beams. We will perform tomographic imaging of hundreds of μm diameter catalyst bodies. The result will set a new record in ptychographic 3D imaging regarding sample size and resolution elements per tomogram from the state-of-art 200M elements/tomogram to 200B elements/tomogram and boosting measurement speed from 15 million elements per hour to a remarkable 2.5B elements per hour.



