Synchrotron X-ray Diffraction Data and Evaluation Workflow for: From Mechanics to Electronics: Influence of ALD Interlayers on the Multiaxial Electro-Mechanical Behavior of Metal-Oxide Bilayers
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Synchrotron X-ray Diffraction Data and Evaluation Workflow for the publication "From Mechanics to Electronics: Influence of ALD Interlayers on the Multiaxial Electro‐Mechanical Behavior of Metal–Oxide Bilayers" obtained at the KMC-II Beamline (DOI: 10.17815/jlsrf-2-65 ) at BESSY-II Synchrotron.
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Zenodo创建时间:
2026-01-21



