Crystallographic data and refinement statistics.

aRsym = Σ|Ii -|/Σ|Ii| where Ii is the intensity of the ith measurement, and is the mean intensity for that reflection. bRwork = Σ| Fobs - Fcalc|/Σ|Fobs| where Fcalc and Fobs are the calculated and observed structure factor amplitudes, respectively. cRfree = as for Rwork, but for 5.0% of the total reflections chosen at random and omitted from refinement for all datasets. *The highest resolution bin statistics were given in the parenthesis.