Data linked to the publication "Van der Waals devices for surface-sensitive experiments" by N. Taufertshöfer et. al.

This repository contains data used for the publication called Van der Waals devices for surface-sensitive experiments. It includes the following files: -Raw ARPES data in matlabs ".mat" format: 4D_ARPES_Fig2_raw_I00016: Coarse 4D (spatial x, spatial y, angle, energy) µARPES scan to locate flakes, shown in Fig. 2b in the paper. 4D_ARPES_Fig3_raw_I00021: Fine 4D (spatial x, spatial y, angle, energy) µARPES scan on the device presented in the paper, i.e. Fig. 3a,d. FermiMap3D_Fig3_P00011: 3D Fermi map shown in Fig. 3c. Spectrum2D_Fig3_P00010: 2D spectrum shown in Fig. 3b. kmeans_cluster_EDCs_mean and kmeans_cluster_EDCs_std-dev: Result of the kmeans clustering in Fig. 3e. -Original images that were used in the publication, including those of the shadow mask in Fig. 2a and Fig. 4 and the evaporated gold contacts in Fig. 2a. -Transport data for the R(T) curve and I(V) measurement in Fig. 2d,e. -AFM scans in a multi-channel-file format (can be opened with e.g. Gwyddion) for the monolayer (0.7 nm), the main bulk flake (45 nm) and the bottom left corner of the flake (24 nm).