Data for "Thickness Variations and Absence of Lateral Compositional Fluctuations in Aberration-Corrected STEM Images of InGaN LED Active Regions at Low Dose"
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Data for Yankovich, A. B., Kvit, A. V., Li, X., Zhang, F., Avrutin, V., Liu, H., Izyumskaya, N., Özgür, U., Van Leer, B., Morkoç, H. & Voyles, P. M. Thickness Variations and Absence of Lateral Compositional Fluctuations in Aberration-Corrected STEM Images of InGaN LED Active Regions at Low Dose. Microsc. Microanal. 20, 864–8 (2014). DOI: 10.1017/S1431927614000427
创建时间：
2020-07-02
