Imaging of graphene surface by means of tapping mode AFM

Graphene [1] is a material consisting of carbon planes with a hexagonal structure. One of the facts of interest from a purely scientific point of view is the very high mobility of electrons in the described material, allowing the study of relativistic effects inside a solid sample. Other features, such as bactericidal activity, make graphene an interesting object of research in the field of medicine. In the electronics industry, it is planned to replace it with the currently most popular material, i.e. silicon. All this makes it the subject of constant research interest also in terms of imaging its structure. The set contains the results of the visualization of graphene layers obtained by sputtering. Topographic measurements with the use of NSG30 probes were made in the semi-contact mode. Atomic force microscopy does not allow for the visualization of the characteristic arrangement of atoms, but it allows for the presence of carbon planes. The file contains 42 images. [1] P. Avouris, C. Dimitrakopoulos, Graphene: Synthesis and applications, Mater. Today. 15 (2012) 86–97. doi:10.1016/S1369-7021(12)70044-5.