High-speed X-ray diffraction microscopy of operating hybrid Bulk and Surface Acoustic Waves (BAW/SAW) device

Exploiting X-ray diffraction microscopy (XDM), this proposal aims at extending our physical description of the wave behaviour in a novel hybrid Bulk / Surface Acoustic Wave (BAW/SAW) device. The expected comprehensive description will contribute to improve the understanding of the interaction between the BAW in the piezoelectric material and the SAW on the surface of the substrate. This in turn will help develop new high frequency, low loss resonators and filters for the next generation of telecommunication standards.