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AFM raw data
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创建时间:
2023-03-06
相关数据集
The morphology of vanadate glasses containing BaTiO3 measured with the use of AFM
The morphology of vanadate glasses doped with BaTiO3 was measured with the use of AFM method. Samples of the composition of x[BaO,TiO2]–(80 − x)V2O5–20Bi2O3 where x = 5, 10 and 15 in mol% were prepare
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Data for: "Processing outcomes of atomic force microscope tip-based nanomilling with different trajectories on single-crystal silicon"
The dataset contains numerical data to illustrate the relationship between the nanochannel depth and the applied normal load. The data can be read by using origin software.
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Data set S1
the data is of Analysis of Physical and Mechanical Properties of Loess in Micro Layer during Moisture Absorption Process based on Atomic Force Bicroscope.
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An open-source and low-cost atomic force microscope controller for high-speed imaging
An open-source and low-cost AFM controller with a sinusoidal scanning function for high-speed scanning. The proposed AFM system achieved a scan rate of 55 line/s (9.3 s/frame for 512×512 pixels image)
Mendeley Data2024-03-27 更新60



