The data of article "Defect structure regulation and thermoelectric transfer performance in n-type Bi2-xSbxTe3-ySey-based compounds"

The data set contains the graph data in Fig. 1 to Fig. 6 of article "Defect structure regulation and thermoelectric transfer performance in n-type Bi2-xSbxTe3-ySey-based compounds", including microstructure characterization, electrical transport properties and thermal transport properties of the materials. Among them, XRD, EPMA and SEM files are sample microstructure data, i.e., Figure 1. Conductivity file is the data of temperature change of the sample's conductivity and Seebeck coefficient in Fig. 2. The pisarenko file is the specific data in Figure 3; Defect formation energy is the calculated result of defect formation energy, as shown in Figure 4. Electronic-hole is the mobility and carrier concentration of electrons and holes in Figure 5. thermal conductivity is the change of thermal diffusion coefficient of the sample with temperature, as shown in Figure 6. The total date file is a summary of thermoelectric transport performance data.