Characterization of minimum material requirements for high-speed X-ray diffraction microscopy of operating Surface Acoustic Waves (SAW) devi

Name: Characterization of minimum material requirements for high-speed X-ray diffraction microscopy of operating Surface Acoustic Waves (SAW) devi
Creator: ESRF, 71 avenue des Martyrs CS 40220, 38043, Grenoble, FRANCE; Eindhoven University of Technology, Department of Mechanical Engineering, Den Dolech 2 P O Box 513, 5600 MB, Eindhoven, NETHERLANDS
Published: 2028-01-01T00:00:00+08:00

ESRF Portal2028-01-01 更新2026-04-23 收录

表面声波器件表征

X射线衍射显微成像

数据链接：

https://doi.esrf.fr/10.15151/ESRF-ES-2264619673 数据链接链接失效反馈

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资源简介：

Exploiting X-ray diffraction microscopy (XDM), this proposal aims at extending our physical description of the wave behavior in a Surface Acoustic Wave (SAW) device. The expected comprehensive description will contribute to improve the understanding of the interaction between the acoustic waves in the piezoelectric material and in the substrate. This in turn will help develop new sensors as well as low loss resonators and filters for the next generation of telecommunication standards. This proposal builds upon the lessons learnt from the beamtime related to proposal ME-1648 and the in-house experiment BLC 15862 for thorough characterization of required material parameters which allow real-time imaging of SAWs at ID01

提供机构：

ESRF, 71 avenue des Martyrs CS 40220, 38043, Grenoble, FRANCE; Eindhoven University of Technology, Department of Mechanical Engineering, Den Dolech 2 P O Box 513, 5600 MB, Eindhoven, NETHERLANDS

创建时间：

2028-01-01

Characterization of minimum material requirements for high-speed X-ray diffraction microscopy of operating Surface Acoustic Waves (SAW) devi

资源简介：

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