Strain mapping of structural defects in a functional Si/SiGe QuBus

Name: Strain mapping of structural defects in a functional Si/SiGe QuBus
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B2FIND2026-04-29 收录

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https://b2find.eudat.eu/dataset/90013612-6fb2-5e7a-8e6b-b52e266207ad

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We will employ Scanning X-Ray Diffraction Microscopy to map the spatial strain distribution in the 8 nm Si/Si0.7Ge0.3 quantum well (QW) layer of a a functional Quantum Bus for...

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