Crystallography data and refinement statistics.
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*: Values in parentheses correspond to the highest resolution shells. #Rmerge = ΣhklΣj∣I(hkl;j)−<I(hkl)>|/(ΣhklΣj<I(hkl)>), where I(hkl;j) is the jth measurement of the intensity of the unique reflection (hkl), and I(hkl) is the mean overall symmetry related measurements. §RMSD: root mean squared deviation.
创建时间：
2011-06-20
