Thermal-Infrared Emission Spectra of Pyrrhotite and Silicate Reference Samples

This data contains spectral measurements of 500-710 micron silicate reference samples during the development of a new calibration procedure for deriving the absolute emissivity of materials in the mid-infrared, specifically those that lack a Christiansen Frequency from 5-50 microns. Spectral measurements of 500-710 micron pyrrhotite were also collected as an analog to explore for sulfide deposits on Mars.