Operando Scanning X-Ray Diffraction Microscopy on Ferroelectric Perovskite Thin Films

Name: Operando Scanning X-Ray Diffraction Microscopy on Ferroelectric Perovskite Thin Films
Creator: Institute of Physics, Dept. of Semiconductor Epitaxy, Universitätsplatz 2, 39106, Magdeburg, GERMANY; Experimentelle Physik, Halbleiterepitaxie, Universitaetsplatz 2, 39106, Magdeburg, GERMANY; Leibniz Institute for Crystal Growth, Max-Born Strasse 2, Berlin -Adlershof, 12489 Berlin, Germany
Published: 2028-01-01T00:00:00+08:00

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数据链接：

https://doi.esrf.fr/10.15151/ESRF-ES-2233628805 数据链接链接失效反馈

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资源简介：

We propose to investigate ferroelectric switching in lead-free monoclinic (K,Na)NbO3 strained thin films. In order to correlate the inversion of spontaneous polarization with changes in atomic structure and domain morphology, operando (scanning) X-ray nano-diffraction shall be performed during/after application of an electric field intended for polarization switching. We plan to use a focused X-ray beam of typically 100 x 100 nm2 size which allows to visualize the temporal evolution of polarization domains and corresponding domain walls with high spatial resolution. These experiments will help correlate switching of spontaneous polarization with changes in atomic structure and domain morphology.

提供机构：

Institute of Physics, Dept. of Semiconductor Epitaxy, Universitätsplatz 2, 39106, Magdeburg, GERMANY; Experimentelle Physik, Halbleiterepitaxie, Universitaetsplatz 2, 39106, Magdeburg, GERMANY; Leibniz Institute for Crystal Growth, Max-Born Strasse 2, Berlin -Adlershof, 12489 Berlin, Germany

创建时间：

2028-01-01