Full 6.5-day CW measurement for Drift Detection

Full 6.5-day CW measurement for Drift Detection
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<strong>Experiment:</strong><br>

-The dataset was captured using the Chipwhisperer CW308, with the target device being STM32F3 with an ARM Cortex-M4<br>
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-The target device performed an AES-128 encryption while we measured the leakage traces<br>
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-The experiment lasted for approximately 6.5 days <br>
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-The data is organized in parts of 100k traces each. Each 100k-sized part was captured in approx. 38 minutes. Each trace has 5k time samples (features). The original experiment has a total of 254 parts of 100k traces each. <br>
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-Every 100k-trace data part is called traces<strong>i</strong>.mat and comes together with label<strong>i</strong>.mat, for indexes i = 1, 2, ..., 254<br>
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-The label<strong>i</strong>.mat is the value of a single sboxoutput of AES-128 i.e. the label ranges in the set {0,1,...,255}. We assume that successfully recovering the sboxoutput implies successfully recovering the respective key byte of AES-128.<br>
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We also have a reduced version of the dataset available here: 
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https://doi.org/10.21942/uva.25061858<br>

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