遇见数据集

Are All Patent Examiners Equal? The Impact of Examiner Characteristics

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NBER2002-06-01 更新2025-01-04 收录
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Building on insights gained from interviewing administrators and patent examiners at the United States Patent and Trademark Office (USPTO), we collect and analyze a novel dataset on patent examiners and patent outcomes. This dataset is based on 182 patents for which the Court of Appeals for the

创建时间:
2002-06-01
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