X-Ray Fluorescence and Reflectography Data from Berlin, Staatsbibliothek zu Berlin manuscript Ms. or. fol. 1216 (Erfurt 7)
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资源简介:
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV light) analysis of inks from Ms. or. fol. 1216 (Erfurt 7). Results published in <em>manuscript cultures</em> 15. Complementary analysis was later performed with a scanning XRF spectrometer.
Erfurt7_reflectography.zip - complete reflectography Dataset
Erfurt7_XRF.zip - complete XRF Dataset
ReportTorah1216.docx - detailed report
提供机构:
Universität Hamburg
创建时间:
2022-07-13



