X-Ray Fluorescence and Reflectography Data from Berlin, Staatsbibliothek zu Berlin manuscript Ms. or. fol. 1216 (Erfurt 7)

XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV light) analysis of inks from Ms. or. fol. 1216 (Erfurt 7). Results published in <em>manuscript cultures</em> 15. Complementary analysis was later performed with a scanning XRF spectrometer. Erfurt7_reflectography.zip - complete reflectography Dataset Erfurt7_XRF.zip - complete XRF Dataset ReportTorah1216.docx - detailed report