X-Ray Fluorescence and Reflectography Data from London, Royal Asiatic Society (RAS), Hodgson Ms 35
收藏University of Hamburg2020-07-01 更新2026-04-17 收录
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https://www.fdr.uni-hamburg.de/record/1121
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资源简介:
XRF (ARTAX: 50kV, 600 µA, linescans of 10 points of 20s each), and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of ink on Hodgson Ms35 from the Royal Asiatic Society, London (UK) as part of SFB950 project C01. Analysis of 9 folios: 31 spots on ink, 9 on palm leaf support: Reflectography_HodgsonMS35.zip - full reflectography dataset XRF_HodgsonMS35.zip - full XRF dataset XRFprocessing_HodgsonMS35.xlsx - detailed XRF results and processing Results_Hodgson MS35.pptx - detailed reflectography and XRF results MSI was also performed to recover damaged writing. Link to dataset is included in related identifier.
提供机构:
Bonnerot, Olivier; Shevchuk, Ivan; Rabin, Ira; Delhey, Martin
创建时间:
2020-07-01



