Imaging ellipsometry on exfoliated GaS on sapphire substrate
收藏NIAID Data Ecosystem2026-05-02 收录
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Delta and Psi maps measured for wavelengths 200 nm to 900 nm with an Accurion EP4 ellipsometer. Ellipsometric enhanced contrast micrograph of the measured region - map.jpg Plotted Delta and Psi maps for 2, 2.5, 3, 3.2 and 3.5 eV are included.
创建时间：
2024-07-17
