Pattern resolution measurements.
收藏Figshare2019-06-06 更新2026-04-29 收录
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Height and width measurements were taken from 20 pillars (or wells, as was the case from the PDMS template). All data is represented as mean ± standard deviation. Standard deviation has been used to show the scattering in measured values. See S2 Fig and S1 Table for AFM and optical profilometer image comparison for the PDMS patterned replication process.
创建时间：
2019-06-06
