Data from: Epitaxial K0.5Na0.5NbO3 thin films by aqueous chemical solution deposition

GIXRD dataAll GIXRD data used in the paper, i.e. GIXRD for KNN with and without salt flux on 100 STO, 110 STO and 111 STO. In addition to this there is GIXRD data on KNN-E-100 thin film heat treated at 700, 800 and 900 degrees celsius (as referred to in the paper).GIXRD.xlsxTheta-2theta XRD dataAll theta-2theta data used in the paper, i.e. for KNN thin films with and without salt flux on 100 STO, 110 STO and 111 STO.Theta_2theta_XRD_data.xlsxPiezoresponse dataAll piezoresponse data used in the paper. This includes PR amplitude, PR phase, dielectric permittivity and loss tangent measurements.Piezoresponse_data.xlsxTGA dataData for the TGA measurement referred to in the paper (alkali loss observed at elevated temperatures.KNN-TG.txtTGA plotThe TGA measurement referred to in the paper (alkali loss observed at elevated temperatures), plotted.TGA-MS data.pngTEM image of plate-like grainsTEM image of plate-like grains at the surface of the KNN-ES-100 thin film, as referred to in the paper.Suppl_figure_B_TEM.JPG