Tracking copper nanofiller evolution in polysiloxane during processing into SiOC ceramic

Polymer-derived ceramics are an interesting class of materials that have application in ultra-high temperature ceramic matrix composites, functional coatings, catalysis, biomedical devices, and energy storage. By starting as pre-ceramic polymers, they have access to polymer processing routes which allow the formation of complex shapes prior to processing into dense, ceramic materials. However, extreme densitification and volume shrinkage during processing often leads to cracking and void formation. To combat this, nanofillers are often added to the polymer matrix prior to processing, which add an unshrinkable component to the matrix and bolster mechanical properties. Despite their interest for several applications, fundamental research into the structural changes occurring during pyolysis and interactions between nanofiller and matrix occurring on the local scale is lacking. In this work, copper nanofiller is added to pre-ceramic polysiloxane, and the resulting composite is heated to 10..., This data was collected at the Advanced Photon Source 11-ID-B beamline (GUP-75644, wavelength 0.2115 Å). Sample-to-detector distances for XRD and PDF were 1m and 180mm, respectively. The data provided here have been calibrated and integrated into 1D I(q) scattering files (.chi format) in which column 1 is the scattering angle 2-theta in degrees and column 2 is integrated intensity. Calibration and integration were performed in GSAS-II using CeO2 (sample-to-detector distances) and Ni standards (instrumental parameters). The area around the beamstop was excluded from integration. For the PDF, scattering from the empty Kapton sample capillary was subtracted during integration., , # Data from: Tracking copper nanofiller evolution in polysiloxane during processing into SiOC ceramic Notes on X-ray scattering data 2023-10-06 Paul Cuillier Data were collected at Advanced Photon Source 11-ID-B, using an area detector. X-ray wavelength was 0.2115 Angstrom. PDF patterns were collected with a 180 mm specimen-to-detector distance. XRD patterns were collected with a 1000 mm specimen-to-detector distance. The exact detector distance was calibrated using the CeO2 standard. The raw images were integrated in GSAS-II. Only the region around the beam stop was excluded from the integration. For PDF data, the scattering from the empty Kapton sample container was subtracted in the integration step. In the .chi files: The first column is the scattering angle 2-theta in degrees. The second column is the integrated intensity. For both the PDF and XRD data, .chi files are named tp indicate processing temperature (X), copper loading (Y), and data type (XRD vs PDF) using the follow...聚合物衍生陶瓷是一类极具研究价值的先进材料，可应用于超高温陶瓷基复合材料、功能涂层、催化、生物医学装置以及储能领域。该类材料以预陶瓷聚合物为起始原料，可依托聚合物加工路径，能够在转化为致密陶瓷材料前制备复杂形状构件。然而，加工过程中的极端致密化与体积收缩往往会引发开裂与孔隙生成。为解决这一问题，科研人员通常会在加工前向聚合物基体中添加纳米填料，为基体引入不可收缩组分，同时强化基体的力学性能。尽管该类材料在诸多应用场景中备受关注，但针对热解过程中发生的结构变化，以及纳米填料与基体在微观尺度下的相互作用，目前仍缺乏系统的基础研究。本研究向聚硅氧烷类预陶瓷聚合物中添加铜纳米填料，将所得复合材料加热至10……。本数据集采集于先进光子源（Advanced Photon Source）11-ID-B光束线（实验编号GUP-75644，波长0.2115 Å。X射线衍射（XRD）与对分布函数（PDF）的样品-探测器距离分别为1米与180毫米。本数据集已完成校准，并整合为一维I(q)散射文件（格式为.chi），其中第一列为以角度表示的散射角2θ（单位：度），第二列为积分后的强度。校准与积分流程均在GSAS-II软件中完成，采用二氧化铈（CeO₂）标准品校准样品-探测器距离，以镍（Ni）标准品校准仪器参数。积分过程中排除了光束挡块周边区域。对于PDF数据，积分过程中已扣除空Kapton样品毛细管的散射本底。 # 数据来源：追踪聚硅氧烷中铜纳米填料在转化为SiOC陶瓷过程中的演化 X射线散射数据说明 2023-10-06 保罗·奎耶（Paul Cuillier） 数据采集于先进光子源11-ID-B光束线，采用面探测器采集。 X射线波长为0.2115埃。 PDF图谱的样品-探测器距离为180毫米，XRD图谱的样品-探测器距离为1000毫米。 准确的探测器距离通过CeO₂标准品校准。 原始图像在GSAS-II软件中完成积分。 积分过程仅排除了光束挡块周边区域。 对于PDF数据，积分步骤中已扣除空Kapton样品容器的散射本底。 在.chi格式文件中： 第一列为以角度表示的散射角2θ（单位：度）。 第二列为积分后的强度。 针对PDF与XRD数据的.chi文件将按照处理温度（X）、铜负载量（Y）与数据类型（XRD与PDF）进行命名，命名规则如下……