I-V traces used to demonstrate automated fitting process

Name: I-V traces used to demonstrate automated fitting process
Creator: Chi-Shung Yip; Hefei Institutes of Physical Science; University of Wisconsin–Madison
Published: 2022-10-24T00:00:00+08:00

科学数据银行2022-10-28 更新2026-04-23 收录

半导体器件参数提取

I-V曲线自动化拟合

数据链接：

https://www.scidb.cn/detail?dataSetId=7c2eab21b23c473ca4e08425b3abaf8b 数据链接链接失效反馈

官方服务：

资源简介：

The I-V traces used to analyze for fig. 7,8,9,11,12 - the key figures of the manuscript.

提供机构：

Chi-Shung Yip; Hefei Institutes of Physical Science; University of Wisconsin–Madison

创建时间：

2022-10-24

I-V traces used to demonstrate automated fitting process

资源简介：

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