Supplementary video for In Situ Tracking of Long-Range Gold Clusters Surface Diffusion Mediating Amorphous Si Crystallization

In situ (S)TEM characterizationIn situ heating TEM, SAED, and EDS characterizations were conducted using a JEM-F200 and a probe-corrected JEM-NEOARM transmission electron microscope, both operated at 200 kV. During in situ experiments, a Gatan OneView high-sensitivity camera was employed, delivering a temporal resolution of 0.5 s per frame. HAADF/ABF-STEM images were also captured on these instruments. Real-time STEM movies were acquired using a double spherical aberration-corrected Thermo Scientific Titan Themis Z transmission electron microscope at an accelerating voltage of 300 kV. The convergence angle was set to 25 mrad, with inner and outer collection angles of 50 mrad and 200 mrad. The screen currents for imaging and EDS analysis were maintained at 0.05 nA and 0.15 nA, respectively.