The associated data for the article "Effect of Preparation Process on the Structure and Properties of the Plastic Thermoelectric Material Ag₂S₀.₄Te₀.₆"

Backscattered electron (BSE) images and EDS elemental distribution maps of Ag, Te, and S for Ag₂S₀.₄Te₀.₆ before and after annealingSynchrotron powder X-ray diffraction (SPXRD) pattern data (λ = 0.490027(0) Å) for Ag₂S₀.₄Te₀.₆ powder samples before and after annealing over the temperature range of 110 K–700 K and upon cooling back to room temperature (300 K)Differential scanning calorimetry (DSC) curves before and after annealingRietveld refinement of SPXRD data using the body-centered cubic Ag₂Te model at 500 K (unannealed sample), 600 K (unannealed sample), 700 K (unannealed sample), 300 K (unannealed sample, after thermal cycling), 300 K (annealed sample), and 300 K (annealed sample, after thermal cycling). Rietveld refinement of SPXRD data using the face-centered cubic Ag₂Te model at 700 K (unannealed sample), 300 K (annealed sample), and 300 K (annealed sample, after thermal cycling)HRTEM images of Ag₂S₀.₄Te₀.₆ samples before and after annealing, along with the corresponding SAED patterns and IFFT images of the crystalline regions after annealingPDF comparison of samples before and after annealing over the range of 2–40 Å at different temperatures. Synchrotron X-ray PDF image of Ag₂S₀.₄Te₀.₆ at 700 K before annealing, with fitting range of 2–30 Å, fitted using average structures of the Im3m and Fm3m space groups. Synchrotron X-ray PDF images fitted using average structures of the Im3m and Fm3m space groups over the range of 2–6 Å at 700 K before annealing and 300 K after annealing, along with PDF data for different atomic pairs obtained from the average structure fitting using the two space groupsThermoelectric performance data