Edge-Defined Film-Fed Silicon Glass–Glass Modules on Florida Rooftop After 22 Years

A set of four edge-defined film-fed growth (EFG) silicon modules from a ten-module system in Florida is measured after 22 years of exposure. Data here include current-voltage I-V, pseudo-I-V obtained using I-V and suns-Voc, carrier lifetime versus excess carrier density data, dark I-V, electroluminescence images at 0.1 and 1 times the nameplate short-circuit current, and visual images showing prominent defects. These data are part of the study published in https://onlinelibrary.wiley.com/doi/full/10.1002/pssr.202200215.

These data were obtained through work supported by the U.S. Department of Energy’s Office of Energy Efficiency and Renewable Energy (EERE) under
the Solar Energy Technologies Office Agreement Numbers DE-EE0008172, DE-EE0008155, and DE-EE0009347. The authors would like to thank Donard Metzger of FSEC for bringing these modules to our attention and helping with installation and measurements.