Raw data files for SI-KCTP @ IPhN2+ Layers
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资源简介：
SEM, infrared, cyclic voltammetry, UV-vis, EDS, and XPS characterization of a set of conjugated thin films. Additional IR, voltammetric, XPS, and UV-vis data has been added (Version 2)<br><br>
创建时间：
2020-02-12
