X-ray data-collection and refinement statistics for NcImpα/SV40NLS structure.

† Rmerge=∑hkl(∑i(∣Ihkl,i−Ihkl>∣))∑hkl,iIhkl>, where Ii (hkl) is the intensity of an individual measurement of the reflection with Miller indices hkl and hI(hkl)i is the mean intensity of this reflection. Calculated for I > -3σ (I) [21].‡ Rcryst=∑hkl(∣∣Fobshkl∣−∣Fcalchkl∣)∣Fobshkl∣, where ∣Fobs∣ and ∣Fcalc∣ are the observed and calculated structure-factor amplitudes, respectively.§ Rfree is equivalent to Rcryst but was calculated with reflections (5%) omitted from the refinement process. Calculated based on the Luzzati plot with the program SFCHECK [31].† † Calculated with the program PROCHECK [31].aValues in parentheses are for the highest-resolution shell.X-ray data-collection and refinement statistics for NcImpα/SV40NLS structure.