Dataset: A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing
收藏Figshare2023-06-04 更新2026-04-28 收录
下载链接：
https://figshare.com/articles/dataset/_strong_Dataset_A_Spectroscopic_Reflectance-Based_Low-Cost_Thickness_Measurement_System_for_Thin_Films_Development_and_Testing_strong_/23285603
下载链接
链接失效反馈官方服务：
资源简介：
This data repository contains the following information related to the Article: "A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing" File 1: RMSE and MSE calculation for SENSOR1 File 2: RMSE and MSE calculation for SENSOR2 File 3: RMSE and MSE calculation for SENSOR2 using HAL/DEUT light source File 4: Interference Interval Method Calculation and Reflectance Curve Modelling
创建时间：
2023-06-04
