Scanning electron microscopy data of plastic fragments sampled during the composting experiment
收藏Recherche Data Gouv France2024-01-01 更新2026-04-09 收录
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The surface properties, fragmentation and the microbial attachment to the surface were be observed in the scanning electron microscopy (SEM). SEM observations were performed using a Desktop SEM (Phenom ProX, Fondis Bioritech, France) with an acceleration voltage ranging between 5 and 10 kV secondary electrons. Samples were directly mounted on stub using carbon conductive tape and then coated with Gold/Palladium during 45 s at 20 mA (4 nm thick) by ion sputtering (Mini Sputter Coater SC7620, Quorum Technologies Ltd, UK).
创建时间：
2024-01-01
