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Strain and Orientation Mapping of NiO Single Crystals and High Entropy Oxides Pellets

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ESRF Portal2024-01-01 更新2026-04-23 收录
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https://doi.esrf.fr/10.15151/ESRF-ES-511134177
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The aim of this proposal is to perform dark field X-ray microscopy (DFXM) to investigate lattice distortions, by probing local orientation and strain variations within bulk NiO and HEO pellets.
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2024-01-01
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