Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices
收藏DataCite Commons2025-10-30 更新2026-05-03 收录
下载链接：
https://data.fz-juelich.de/citation?persistentId=doi:10.26165/JUELICH-DATA/BO2NPG
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资源简介：
This dataset contains raw and processed read noise measurements from thermally oxidized TaOx-based VCM devices, supporting the analysis presented in the associated APL publication. The raw data includes 1 s current readout traces recorded after resistive switching. The evaluation folder provides Python scripts used for data analysis and a pickled DataFrame with derived parameters.
提供机构：
Jülich DATA
创建时间：
2025-08-22
