Data to accompany "Low Electron Beam Energy X-ray Microanalysis: The Adventure Continues!"
收藏NIST Chemistry WebBook2023-01-11 更新2026-03-14 收录
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https://data.nist.gov/od/id/mds2-2853
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EDS spectra measured at E0 = 5 keV for 75 materials are provided along with the standards used for quantification with the NIST DTSA-II software for electron-excited X-ray microanalysis with energy dispersive spectrometry.
