Large Feature Model Benchmarks

This deposit contains benchmarks used for evaluation of Baital tool https://github.com/meelgroup/baital. Originally from: T. Pett, T. Thum, T. Runge, S. Krieter, M. Lochau, and I. Schaefer, "Product sampling for product lines: The scalability challenge." A. Knuppel, T. Thum, S. Mennicke, J. Meinicke, and I. Schaefer, "Is there a mismatch between real-world feature models and product-line research?" in Proceedings of the 2017 11th Joint Meeting on Foundations of Software Engineering. ACM, 2017 J. H. Liang, V. Ganesh, K. Czarnecki, and V. Raman, "Sat-based analysis of large real-world feature models is easy," in Proceedings of the 19th International Conference on Software Product Line. ACM, 2015 Q. Plazar, M. Acher, G. Perrouin, X. Devroey, and M. Cordy, "Uniform sampling of sat solutions for configurable systems: Are we there yet?" in 2019 12th IEEE Conference on Software Testing, Validation and Verification (ICST). IEEE, 2019