Examination of Ion Irradiation of Ternary Pyrochlore Oxides

Ion irradiation damage was measured on polycrystalline synthetic samples of Y2Ti2-xSnxO7 (x = 0.4, 0.8, 1.2 and 1.6), in situ with Nd2Zr2O7, Nd2Zr1.2Ti0.8O7, and La1.6Y0.4Hf2O7 using a voltage electron microscope (IVEM) at Argonne National Laboratory (ANL). Measurements were taken at 1.0 MeV Kr ions at temperatures of 50 to 650 K.

本研究针对Y₂Ti₂₋ₓSnₓO₇（x=0.4、0.8、1.2及1.6）的多晶合成样品开展了离子辐照损伤测试，并同步对Nd₂Zr₂O₇、Nd₂Zr₁.₂Ti₀.₈O₇及La₁.₆Y₀.₄Hf₂O₇样品进行了原位对照测试；全部测试均在阿贡国家实验室（Argonne National Laboratory, ANL）的高压电子显微镜（IVEM）中完成。测试采用1.0 MeV的氪离子作为辐照粒子，测试温度区间为50至650开尔文。