Production and Defect Engineering of MoO3-x Pseudo-Layers for Electronic Applications
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资源简介：
This dataset comprises UV–Vis spectroscopy, atomic force microscopy (AFM), Raman spectroscopy, X-ray diffraction (XRD), and electrical measurements performed on as-grown and modified MoO₃₋ₓ pseudo-layers.
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Zenodo创建时间：
2026-08-14
