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Fokker-Planck speckle-based tensor tomography

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Mendeley Data2024-01-31 更新2024-06-29 收录
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Speckle-based X-ray imaging is an experimentally simple low-exposure imaging technique capable of extracting information regarding a sample’s microstructural organisation, namely through directional dark-field imaging. This proposal will implement and develop the first speckle-based dark-field tensor-tomography experiments, at ID19. Currently, using speckle-based approaches, directional dark-field imaging is limited to projection, therefore providing only two-dimensional information. Current tensor-tomography techniques require tomographic data to be collected about multiple axes of rotation. Due to the two-dimensional sensitivity of speckle-based imaging, data is required about only two rotation axes, making it more dose efficient. We have developed the critical underlying theoretical formalisms and believe that experimental implementation is the next significant step to develop speckle-based X-ray imaging into a user-friendly high-resolution imaging modality.

基于散斑的X射线成像(Speckle-based X-ray imaging)是一种实验操作简便、低曝光量的成像技术,可通过定向暗场成像(directional dark-field imaging)提取样品微观结构组织的相关信息。本提案将在ID19开展首个基于散斑的暗场张量层析成像(tensor-tomography)实验并进行相关开发。当前,基于散斑的定向暗场成像技术仅局限于投影成像场景,仅能提供二维信息。现有张量层析成像技术需围绕多个旋转轴采集层析数据;而基于散斑的成像具备二维灵敏度特性,仅需围绕两个旋转轴采集数据,因此剂量利用效率更高。我们已构建了该技术的核心基础理论框架,且认为实验落地是将基于散斑的X射线成像发展为易用型高分辨率成像模态的下一关键步骤。

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2024-01-31
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