Diffraction Data for SRM 640f
收藏DataCite Commons2025-07-21 更新2025-04-16 收录
下载链接：
https://data.nist.gov/od/id/mds2-2251
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资源简介：
The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. Almost all of it is collected using a position-sensitive detector (PSD), and is stored in CIF format.
提供机构：
National Institute of Standards and Technology
创建时间：
2020-06-22
