Stim circuits and collected data for "Error-corrected Hadamard gate simulated at the circuit level" manuscript

Name: Stim circuits and collected data for "Error-corrected Hadamard gate simulated at the circuit level" manuscript
Creator: University of Cambridge; University of Sheffield; Riverlane
Published: 2023-12-15T00:00:00+08:00

Zenodo2023-12-15 更新2026-04-07 收录

量子纠错电路模拟

容错量子门评估

数据链接：

https://zenodo.org/doi/10.5281/zenodo.10391116 数据链接链接失效反馈

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资源简介：

The stim circuits which we sampled to obtain logical failure probabilities, and the collected data organised in an excel file.

提供机构：

University of Cambridge; University of Sheffield; Riverlane

创建时间：

2023-12-15

Stim circuits and collected data for "Error-corrected Hadamard gate simulated at the circuit level" manuscript

资源简介：

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