S1_XPS
收藏DataCite Commons2020-08-26 更新2024-07-28 收录
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https://figshare.com/articles/S1_XPS/11722467
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资源简介：
X-ray photoelectron spectroscopy data acquired for epitaxial graphene on silicon carbide intercalated with Ga, In, or Sn.<br>"All Elements_O2HeEG_annealed at intercalation conditions" contains spectra for a sample of epitaxial graphene on silicon carbide (EG/SiC) that was exposed to a 50W O2/He plasma for 60s and subsequently annealed at 800C, 300 Torr for 30 minutes under 50 sccm Ar. <br>"All Elements_O2HeEG_SiC_HOPG_AsGrownEG_HydrogEG_GaIntO2HeEG_GaIntAsGrownEG" contains spectra for the following samples: O2/He plasma treated EG/SiC, bare SiC, highly ordered pyrolytic graphite (HOPG), as-grown EG/SiC, hydrogenated (or hydrogen intercalated) EG/SiC, Ga-intercalated, O2/He plasma treated EG/SiC, and Ga-intercalated as-grown EG/SiC. This file contains C 1s, O 1s, Si 2p, Ga 3d, and survey spectra.<br>"InSnInterc" contains O 1s, Si 2p ,C 1s, Sn 3d and In 3d spectra for Sn and In-intercalated, O2/He plasma treated EG/SiC.<br>
提供机构：
figshare
创建时间：
2020-01-29
