NEAR AMBIENT PRESSURE PHOTOEMISSION STUDY OF METAL-OXIDE MEMBRANES BASED ON NiO AND Ga2O3

In this proposal, NiO and Ga2O3 samples in form of membranes and quasi-2D materials will be analyzed by means of XPS. In-situ XPS under near-ambient pressure (1-2 mbar, O2) and variable temperature (up to 600 ºC) at the CIRCE beamline will lead to achieve valuable information on the properties of these wide bandgaps (WBG) oxides at the quasi-2D scale, and their surface electronic properties under diverse pressure/temperature conditions. The oxygen deficiency and related defects, which play a key role in the properties of these oxides, will be studied based on the capabilities of the endstation. Besides, the in-situ NAPP-XPS results expected to be obtained in this proposal will be combined with some other in-situ SEM results, as well as results acquired by means of diverse microscopy and spectroscopy techniequs in the search of improved knowledge of these materials at the q-2D scale. These insights will also lead to improve te synthesis techniques, paving the way for the development of future optimized devices based on q-2D WBG oxides.