GaN Schottky I-V dataset and reproducibility code for reliability-aware sparse-temperature measurement planning

Audited canonical current-voltage dataset and reproducibility materials for reliability-aware sparse-temperature characterization of an Au/Ni/n-GaN Schottky diode. The package contains 5,189 experimental I-V points measured at 19 temperatures from 40 to 400 K, reference Linear/PCHIP leave-one-temperature-out analysis code, and finite-schedule reliability summaries. Version 1.1.0 additionally includes an exploratory graphene/p-Ge application, its analysis script, and derived summary tables; the original third-party measurements are linked but not redistributed.