Diffraction data for SRM 1979
收藏DataCite Commons2025-07-21 更新2025-04-16 收录
下载链接：
https://data.nist.gov/od/id/mds2-2269
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资源简介：
The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. Almost all of it is collected using a position-sensitive detector (PSD), and is stored in ASCII-text pixdat files, which consist of a series of records each of which records the angle, counting time, and counts in each of the 192 pixels of the detector. We also generate ASCII-text metadata files which include the sample name and various run parameters for each scan. Environmental metadata (temperatures, etc.) are collected by an independent computer, and stored as sqlite3 databases with a timestamp,keyword,value architecture.
提供机构：
National Institute of Standards and Technology
创建时间：
2020-07-17
