Data for: “Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films”
收藏DataCite Commons2020-07-30 更新2025-04-17 收录
下载链接：
https://pureportal.strath.ac.uk/en/datasets/b5238863-a088-4f30-8b13-2625260eb73a
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资源简介：
Scanning electron microscope images, electron channelling contrast micrographs, Electron backscatter diffraction data and cathodoluminescence data
提供机构：
University of Strathclyde
创建时间：
2019-10-28
