Topographic AFM imaging of the leaf surface with magnification of details of its morphological structure

Topographic imaging of the leaf surface with magnification of details of its morphological structure. Measurements in semi-contact mode. NTEGRA Prima (NT-MDT) device. NSG 01 probe.
Atomic force microscopy is a research technique involving the mechanical interaction between the surface of the test sample and the probe in the shape of a pyramidal blade. Depending on the applied force of impact, the described technique may be characterized by a different degree of destructiveness for the object subjected to imaging. In the case of particularly delicate samples, their degradation (scratches) may occur when excessive contact forces are applied. Semi-contact or non-contact techniques are used to study mechanically unstable objects such as biological samples (cells, DNA chains or tissues), minimizing the contact time between the probe and the tested surface. The presented file contains the results of scanning in one of the above variants (tapping mode) in relation to the leaf sample. Thanks to the use of the semi-contact technique, it was possible to distinguish delicate structural elements that could be damaged when trying to scan in the contact mode. The file contains 36 images.