Data for "High-precision scanning transmission electron microscopy at coarse pixel sampling for reduced electron dose"
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Data for Yankovich, A. B., Berkels, B., Dahmen, W., Binev, P. & Voyles, P. M. High-precision scanning transmission electron microscopy at coarse pixel sampling for reduced electron dose. Adv. Struct. Chem. Imaging 1, 2 (2015). DOI: 10.1186/s40679-015-0003-9
创建时间：
2020-07-02
