We will be measuring X-ray reflectivity and other scattering techniques available at the beamline, of various samples that have quantum applications. These sample consist of stacked films with differe
Title of program: LEED BEAM-SYMMETRIZED Catalogue Id: ACKG_v1_0 Nature of problem Experiments with low energy electron diffraction(LEED)are used for finding the composition of the unit mesh of c
Abstract We describe a FORTRAN-90 program to compute low-energy electron diffraction I(V) curves. Plane-waves and layer doubling are used to compute the inter-layer multiple-scattering, while the in
